The objective of this workshop is to present an overview of the concept papers developed for the technology-related topics that include reliability testing of micro and nano systems and the effects of space radiation on MNT devices. In this paper we present an overview of the current state of the art in reliability testing of microsensors and microactuators. The complete paper comprises of three major parts namely; (i) Literature review of reliability testing of microsystems from academic and industrial resources, (ii) Review of applicable reliability standards in terms of Military Specifications and Space Applications Standards, and (iii) General strategy for space qualification of MNT. This programmatic aspect will focus on the creation of a 3-5 year MNT reliability program which is aimed at having broad applicability for dealing with engineering reliability into these systems, and building a reliability infrastructure that will allow for rapid prototyping and portability of MNT across various technologies and vendors.